Measurement and Modeling of Single Event Transients in 12nm Inverters
Agarwal, Sapan A.; Clark, Lawrence T.; YoungSciortino, Clifford Y.; Ng, Garrick N.; Black, Dolores A.; Cannon, Matthew J.; Black, Jeffrey B.; Quinn, Heather; Barnaby, Hugh J.; Brunhaver, John S.; Marinella, Matthew J.
Abstract not provided.