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Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Digital Structures

Wallace, Trace; Spear, M.; Privat, A.; Neuendank, J.; Irumva, G.; Wilson, Donald; Esqueda, I.S.; Barnaby, H.J.; Turowski, M.; Mikkola, E.; Gutierrez, Amos; Hughart, David R.; Marinella, Matthew J.; Vonniederhausern, R.; Holloway, S.; Beltran, D.

Abstract not provided.