Publications Details

Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose

Esposito, Madeline G.; Manuel, Jack E.; Vizkelethy, Gyorgy V.; Garland, Diana; Bielejec, Edward S.; Xiao, Tianyao X.; Dickerson, Jeramy R.; McLain, Michael L.; King, Michael P.; Marinella, Matthew J.; Ashby, David; Talin, A.A.; Brunhaver, John S.; Privat, Aymeric; Barnaby, Hugh

Abstract not provided.