Publications Details

Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose

Esposito, Madeline G.; Manuel, Jack; Vizkelethy, Gyorgy; Garland, D.; Bielejec, Edward S.; Xiao, Tianyao P.; Dickerson, Jeramy; Mclain, Michael; King, Michael P.; Marinella, Matthew; Ashby, David S.; Talin, Albert A.; Brunhaver, John S.; Privat, Aymeric; Barnaby, Hugh

Abstract not provided.