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Corroborating Tomographic Defect Metrics with Processing Parameters & Mechanical Response in Metal AM

Madison, Jonathan D.; Bays, Nathan R.; Swiler, Laura P.; Boyce, Brad L.; Jared, Bradley H.; Rodelas, Jeffrey; Salzbrenner, Bradley; Webb, Kevin; Jacques, Carl L.; Romero, Joseph A.; Kernen, Burke L.; Moore, D.G.

Abstract not provided.