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Analysis and mitigation of parasitic resistance effects for analog in-memory neural network acceleration

Semiconductor Science and Technology

Xiao, Tianyao X.; Feinberg, Benjamin F.; Rohan, Jacob N.; Bennett, Christopher H.; Agarwal, Sapan A.; Marinella, Matthew J.

To support the increasing demands for efficient deep neural network processing, accelerators based on analog in-memory computation of matrix multiplication have recently gained significant attention for reducing the energy of neural network inference. However, analog processing within memory arrays must contend with the issue of parasitic voltage drops across the metal interconnects, which distort the results of the computation and limit the array size. This work analyzes how parasitic resistance affects the end-to-end inference accuracy of state-of-the-art convolutional neural networks, and comprehensively studies how various design decisions at the device, circuit, architecture, and algorithm levels affect the system's sensitivity to parasitic resistance effects. A set of guidelines are provided for how to design analog accelerator hardware that is intrinsically robust to parasitic resistance, without any explicit compensation or re-training of the network parameters.

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Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors

IEEE Transactions on Nuclear Science

Cannon, Matthew J.; Rodrigues, Arun; Black, Dolores A.; Black, Jeff; Bustamante, Luis G.; Feinberg, Benjamin F.; Quinn, Heather; Clark, Lawrence T.; Brunhaver, John S.; Barnaby, Hugh; McLain, Michael L.; Agarwal, Sapan A.; Marinella, Matthew J.

Integration-technology feature shrink increases computing-system susceptibility to single-event effects (SEE). While modeling SEE faults will be critical, an integrated processor's scope makes physically correct modeling computationally intractable. Without useful models, presilicon evaluation of fault-tolerance approaches becomes impossible. To incorporate accurate transistor-level effects at a system scope, we present a multiscale simulation framework. Charge collection at the 1) device level determines 2) circuit-level transient duration and state-upset likelihood. Circuit effects, in turn, impact 3) register-transfer-level architecture-state corruption visible at 4) the system level. Thus, the physically accurate effects of SEEs in large-scale systems, executed on a high-performance computing (HPC) simulator, could be used to drive cross-layer radiation hardening by design. We demonstrate the capabilities of this model with two case studies. First, we determine a D flip-flop's sensitivity at the transistor level on 14-nm FinFet technology, validating the model against published cross sections. Second, we track and estimate faults in a microprocessor without interlocked pipelined stages (MIPS) processor for Adams 90% worst case environment in an isotropic space environment.

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Ionizing Radiation Effects in SONOS-Based Neuromorphic Inference Accelerators

IEEE Transactions on Nuclear Science

Xiao, Tianyao X.; Bennett, Christopher H.; Agarwal, Sapan A.; Hughart, David R.; Barnaby, Hugh J.; Puchner, Helmut; Prabhakar, Venkatraman; Talin, A.A.; Marinella, Matthew J.

We evaluate the sensitivity of neuromorphic inference accelerators based on silicon-oxide-nitride-oxide-silicon (SONOS) charge trap memory arrays to total ionizing dose (TID) effects. Data retention statistics were collected for 16 Mbit of 40-nm SONOS digital memory exposed to ionizing radiation from a Co-60 source, showing good retention of the bits up to the maximum dose of 500 krad(Si). Using this data, we formulate a rate-equation-based model for the TID response of trapped charge carriers in the ONO stack and predict the effect of TID on intermediate device states between 'program' and 'erase.' This model is then used to simulate arrays of low-power, analog SONOS devices that store 8-bit neural network weights and support in situ matrix-vector multiplication. We evaluate the accuracy of the irradiated SONOS-based inference accelerator on two image recognition tasks - CIFAR-10 and the challenging ImageNet data set - using state-of-the-art convolutional neural networks, such as ResNet-50. We find that across the data sets and neural networks evaluated, the accelerator tolerates a maximum TID between 10 and 100 krad(Si), with deeper networks being more susceptible to accuracy losses due to TID.

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An Analog Preconditioner for Solving Linear Systems [Slides]

Feinberg, Benjamin F.; Wong, Ryan; Xiao, Tianyao X.; Rohan, Jacob N.; Boman, Erik G.; Marinella, Matthew J.; Agarwal, Sapan A.; Ipek, Engin

This presentation concludes in situ computation enables new approaches to linear algebra problems which can be both more effective and more efficient as compared to conventional digital systems. Preconditioning is well-suited to analog computation due to the tolerance for approximate solutions. When combined with prior work on in situ MVM for scientific computing, analog preconditioning can enable significant speedups for important linear algebra applications.

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An Analog Preconditioner for Solving Linear Systems

Proceedings - International Symposium on High-Performance Computer Architecture

Feinberg, Benjamin F.; Wong, Ryan; Xiao, Tianyao X.; Rohan, Jacob N.; Boman, Erik G.; Marinella, Matthew J.; Agarwal, Sapan A.; Ipek, Engin

Over the past decade as Moore's Law has slowed, the need for new forms of computation that can provide sustainable performance improvements has risen. A new method, called in situ computing, has shown great potential to accelerate matrix vector multiplication (MVM), an important kernel for a diverse range of applications from neural networks to scientific computing. Existing in situ accelerators for scientific computing, however, have a significant limitation: These accelerators provide no acceleration for preconditioning-A key bottleneck in linear solvers and in scientific computing workflows. This paper enables in situ acceleration for state-of-The-Art linear solvers by demonstrating how to use a new in situ matrix inversion accelerator for analog preconditioning. As existing techniques that enable high precision and scalability for in situ MVM are inapplicable to in situ matrix inversion, new techniques to compensate for circuit non-idealities are proposed. Additionally, a new approach to bit slicing that enables splitting operands across multiple devices without external digital logic is proposed. For scalability, this paper demonstrates how in situ matrix inversion kernels can work in tandem with existing domain decomposition techniques to accelerate the solutions of arbitrarily large linear systems. The analog kernel can be directly integrated into existing preconditioning workflows, leveraging several well-optimized numerical linear algebra tools to improve the behavior of the circuit. The result is an analog preconditioner that is more effective (up to 50% fewer iterations) than the widely used incomplete LU factorization preconditioner, ILU(0), while also reducing the energy and execution time of each approximate solve operation by 1025x and 105x respectively.

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Analog architectures for neural network acceleration based on non-volatile memory

Applied Physics Reviews

Xiao, Tianyao X.; Bennett, Christopher H.; Feinberg, Benjamin F.; Agarwal, Sapan A.; Marinella, Matthew J.

Analog hardware accelerators, which perform computation within a dense memory array, have the potential to overcome the major bottlenecks faced by digital hardware for data-heavy workloads such as deep learning. Exploiting the intrinsic computational advantages of memory arrays, however, has proven to be challenging principally due to the overhead imposed by the peripheral circuitry and due to the non-ideal properties of memory devices that play the role of the synapse. We review the existing implementations of these accelerators for deep supervised learning, organizing our discussion around the different levels of the accelerator design hierarchy, with an emphasis on circuits and architecture. We explore and consolidate the various approaches that have been proposed to address the critical challenges faced by analog accelerators, for both neural network inference and training, and highlight the key design trade-offs underlying these techniques.

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Results 26–50 of 149
Results 26–50 of 149