Publications

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We demonstrate SONOS (silicon-oxide-nitride-oxide-silicon) analog memory arrays that are optimized for neural network inference. The devices are fabricated in a 40nm process and operated in the subthreshold regime for in-memory matrix multiplication. Subthreshold operation enables low conductances to be implemented with low error, which matches the typical weight distribution of neural networks, which is heavily skewed toward near-zero values. This leads to high accuracy in the presence of programming errors and process variations. We simulate the end-To-end neural network inference accuracy, accounting for the measured programming error, read noise, and retention loss in a fabricated SONOS array. Evaluated on the ImageNet dataset using ResNet50, the accuracy using a SONOS system is within 2.16% of floating-point accuracy without any retraining. The unique error properties and high On/Off ratio of the SONOS device allow scaling to large arrays without bit slicing, and enable an inference architecture that achieves 20 TOPS/W on ResNet50, a > 10× gain in energy efficiency over state-of-The-Art digital and analog inference accelerators.

We investigate the sensitivity of silicon-oxide-nitride-silicon-oxide (SONOS) charge trapping memory technology to heavy-ion induced single-event effects. Threshold voltage ( V_T ) statistics were collected across multiple test chips that contained in total 18 Mb of 40-nm SONOS memory arrays. The arrays were irradiated with Kr and Ar ion beams, and the changes in their V_T distributions were analyzed as a function of linear energy transfer (LET), beam fluence, and operating temperature. We observe that heavy ion irradiation induces a tail of disturbed devices in the 'program' state distribution, which has also been seen in the response of floating-gate (FG) flash cells. However, the V_T distribution of SONOS cells lacks a distinct secondary peak, which is generally attributed to direct ion strikes to the gate-stack of FG cells. This property, combined with the observed change in the V_T distribution with LET, suggests that SONOS cells are not particularly sensitive to direct ion strikes but cells in the proximity of an ion's absorption can still experience a V_T shift. These results shed new light on the physical mechanisms underlying the V_T shift induced by a single heavy ion in scaled charge trap memory.

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Area efficient self-correcting flip-flops for use with triple modular redundant (TMR) soft-error hardened logic are implemented in a 12-nm finFET process technology. The TMR flip-flop slave latches self-correct in the clock low phase using Muller C-elements in the latch feedback. These C-elements are driven by the two redundant stored values and not by the slave latch itself, saving area over a similar implementation using majority gate feedback. These flip-flops are implemented as large shift-register arrays on a test chip and have been experimentally tested for their soft-error mitigation in static and dynamic modes of operation using heavy ions and protons. We show how high clock skew can result in susceptibility to soft-errors in the dynamic mode, and explain the potential failure mechanism.

As transistors have been scaled over the past decade, modern systems have become increasingly susceptible to faults. Increased transistor densities and lower capacitances make a particle strike more likely to cause an upset. At the same time, complex computer systems are increasingly integrated into safety-critical systems such as autonomous vehicles. These two trends make the study of system reliability and fault tolerance essential for modern systems. To analyze and improve system reliability early in the design process, new tools are needed for RTL fault analysis.This paper proposes Eris, a novel framework to identify vulnerable components in hardware designs through fault-injection and fault propagation tracking. Eris builds on ESSENT - a fast C/C++ RTL simulation framework - to provide fault injection, fault tracking, and control-flow deviation detection capabilities for RTL designs. To demonstrate Eris' capabilities, we analyze the reliability of the open source Rocket Chip SoC by randomly injecting faults during thousands of runs on four microbenchmarks. As part of this analysis we measure the sensitivity of different hardware structures to faults based on the likelihood of a random fault causing silent data corruption, unrecoverable data errors, program crashes, and program hangs. We detect control flow deviations and determine whether or not they are benign. Additionally, using Eris' novel fault-tracking capabilities we are able to find 78% more vulnerable components in the same number of simulations compared to RTL-based fault injection techniques without these capabilities. We will release Eris as an open-source tool to aid future research into processor reliability and hardening.

Non-volatile memory arrays require select devices to ensure accurate programming. The one-selector one-resistor (1S1R) array where a two-terminal nonlinear select device is placed in series with a resistive memory element is attractive due to its high-density data storage; however, the effect of the nonlinear select device on the accuracy of analog in-memory computing has not been explored. This work evaluates the impact of select and memory device properties on the results of analog matrix-vector multiplications. We integrate nonlinear circuit simulations into CrossSim and perform end-to-end neural network inference simulations to study how the select device affects the accuracy of neural network inference. We propose an adjustment to the input voltage that can effectively compensate for the electrical load of the select device. Our results show that for deep residual networks trained on CIFAR-10, a compensation that is uniform across all devices in the system can mitigate these effects over a wide range of values for the select device I-V steepness and memory device On/Off ratio. A realistic I-V curve steepness of 60 mV/dec can yield an accuracy on CIFAR-10 that is within 0.44% of the floating-point accuracy.

As transistors have been scaled over the past decade, modern systems have become increasingly susceptible to faults. Increased transistor densities and lower capacitances make a particle strike more likely to cause an upset. At the same time, complex computer systems are increasingly integrated into safety-critical systems such as autonomous vehicles. These two trends make the study of system reliability and fault tolerance essential for modern systems. To analyze and improve system reliability early in the design process, new tools are needed for RTL fault analysis.This paper proposes Eris, a novel framework to identify vulnerable components in hardware designs through fault-injection and fault propagation tracking. Eris builds on ESSENT - a fast C/C++ RTL simulation framework - to provide fault injection, fault tracking, and control-flow deviation detection capabilities for RTL designs. To demonstrate Eris' capabilities, we analyze the reliability of the open source Rocket Chip SoC by randomly injecting faults during thousands of runs on four microbenchmarks. As part of this analysis we measure the sensitivity of different hardware structures to faults based on the likelihood of a random fault causing silent data corruption, unrecoverable data errors, program crashes, and program hangs. We detect control flow deviations and determine whether or not they are benign. Additionally, using Eris' novel fault-tracking capabilities we are able to find 78% more vulnerable components in the same number of simulations compared to RTL-based fault injection techniques without these capabilities. We will release Eris as an open-source tool to aid future research into processor reliability and hardening.

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To support the increasing demands for efficient deep neural network processing, accelerators based on analog in-memory computation of matrix multiplication have recently gained significant attention for reducing the energy of neural network inference. However, analog processing within memory arrays must contend with the issue of parasitic voltage drops across the metal interconnects, which distort the results of the computation and limit the array size. This work analyzes how parasitic resistance affects the end-to-end inference accuracy of state-of-the-art convolutional neural networks, and comprehensively studies how various design decisions at the device, circuit, architecture, and algorithm levels affect the system's sensitivity to parasitic resistance effects. A set of guidelines are provided for how to design analog accelerator hardware that is intrinsically robust to parasitic resistance, without any explicit compensation or re-training of the network parameters.

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We evaluate the sensitivity of neuromorphic inference accelerators based on silicon-oxide-nitride-oxide-silicon (SONOS) charge trap memory arrays to total ionizing dose (TID) effects. Data retention statistics were collected for 16 Mbit of 40-nm SONOS digital memory exposed to ionizing radiation from a Co-60 source, showing good retention of the bits up to the maximum dose of 500 krad(Si). Using this data, we formulate a rate-equation-based model for the TID response of trapped charge carriers in the ONO stack and predict the effect of TID on intermediate device states between 'program' and 'erase.' This model is then used to simulate arrays of low-power, analog SONOS devices that store 8-bit neural network weights and support in situ matrix-vector multiplication. We evaluate the accuracy of the irradiated SONOS-based inference accelerator on two image recognition tasks - CIFAR-10 and the challenging ImageNet data set - using state-of-the-art convolutional neural networks, such as ResNet-50. We find that across the data sets and neural networks evaluated, the accelerator tolerates a maximum TID between 10 and 100 krad(Si), with deeper networks being more susceptible to accuracy losses due to TID.

Integration-technology feature shrink increases computing-system susceptibility to single-event effects (SEE). While modeling SEE faults will be critical, an integrated processor's scope makes physically correct modeling computationally intractable. Without useful models, presilicon evaluation of fault-tolerance approaches becomes impossible. To incorporate accurate transistor-level effects at a system scope, we present a multiscale simulation framework. Charge collection at the 1) device level determines 2) circuit-level transient duration and state-upset likelihood. Circuit effects, in turn, impact 3) register-transfer-level architecture-state corruption visible at 4) the system level. Thus, the physically accurate effects of SEEs in large-scale systems, executed on a high-performance computing (HPC) simulator, could be used to drive cross-layer radiation hardening by design. We demonstrate the capabilities of this model with two case studies. First, we determine a D flip-flop's sensitivity at the transistor level on 14-nm FinFet technology, validating the model against published cross sections. Second, we track and estimate faults in a microprocessor without interlocked pipelined stages (MIPS) processor for Adams 90% worst case environment in an isotropic space environment.

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