Increasing the objectivity of the “Objective Evidence” Provided by Surface Insulation Resistance Testing Kottwitz, Matthew; Grosso, Samuel; Trofe, Anthony J. Abstract not provided. More Details TYPE Conference Presenation YEAR 2023 DOIOSTI
Systematic Investigation of SIR Testing Phenomena with Constant Capacitance Interdigitated Comb Patterns Kottwitz, Matthew; Glidwell, Bobby; Grosso, Samuel; Mcmeen, Mark; Bixenman, Mike; Fowler, James E. Abstract not provided. More Details TYPE Conference Paper YEAR 2022 OSTI
Systematic Investigation of SIR Testing Phenomena with Constant Capacitance Interdigitated Comb Patterns Kottwitz, Matthew; Glidwell, Bobby; Grosso, Samuel; Mcmeen, Mark; Bixenman, Mike; Fowler, James E. Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI
Effect of Voltage Bias on SIR Measurements Grosso, Samuel; Fowler, James E.; Kottwitz, Matthew; Williard, John Abstract not provided. More Details TYPE Conference Paper YEAR 2022 OSTI
Effect of Bias Voltage on Surface Insulation Resistance Measurements Grosso, Samuel; Fowler, James E.; Kottwitz, Matthew; Williard, John Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI