Publications

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Current-voltage (I-V) curve traces of photovoltaic (PV) systems can provide detailed information for diagnosing fault conditions. The present work implemented an in situ, automatic I-V curve tracer system coupled with Support Vector Machine and a Gaussian Process algorithms to classify and estimate abnormal and normal PV performance. The approach successfully identified normal and fault conditions. In addition, the Gaussian Process regression algorithm was used to estimate ideal I-V curves based on a given irradiance and temperature condition. The estimation results were then used to calculate the lost power due to the fault condition.

The Sandia Array Performance Model (SAPM), a semi-empirical model for predicting PV system power, has been in use for more than a decade. While several studies have presented laboratory intercomparisons of measurements and analysis, detailed procedures for determining model coefficients have never been published. Independent test laboratories must develop in-house procedures to determine SAPM coefficients, which contributes to uncertainty in the resulting models. In response to requests from commercial laboratories and module manufacturers, Sandia has formally documented the measurement and analysis methods as a supplement to the original model description. In this paper we present a description of the measurement procedures and an example analysis for calibrating the SAPM.

Determination of module temperature coefficients for voltage, current and power requires measuring the average of cell temperatures. Conventional practice is to place thermocouples or resistive temperature devices (RTDs) at a few locations on a module's back surface and to average the readings, which may not accurately represent the average temperature over all cells. We investigate the suitability of averaging RTDs, which measure average temperature along a 1m length, to accurately measure the average cell temperature when determining temperature coefficients outdoors.

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The Sandia Array Performance Model (SAPM), a semi-empirical model for predicting PV system power, has been in use for more than a decade. While several studies have presented comparisons of measurements and analysis results among laboratories, detailed procedures for determining model coefficients have not yet been published. Independent test laboratories must develop in-house procedures to determine SAPM coefficients, which contributes to uncertainty in the resulting models. Here we present a standard procedure for calibrating the SAPM using outdoor electrical and meteorological measurements. Analysis procedures are illustrated with data measured outdoors for a 36-cell silicon photovoltaic module.

Reflection losses from a PV module become increasingly pronounced at solar incident angles >60°. However, accurate measurement in this region can be problematic due to tracker articulation limits and irradiance reference device calibration. We present the results of a measurement method enabling modules to be tested over the full range of 0-90° by articulating the tracker in elevation only. This facilitates the use of a shaded pyranometer to make a direct measurement of the diffuse component, reducing measurement uncertainty. We further present the results of a real-time intercomparison performed by two independent test facilities ∼10 km apart.

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We present a method for measuring the series resistance of the PV module, string, or array that does not require measuring a full IV curve or meteorological data. Our method relies only on measurements of open circuit voltage and maximum power voltage and current, which can be readily obtained using standard PV monitoring equipment; measured short circuit current is not required. We validate the technique by adding fixed resistors to a PV circuit and demonstrating that the method can predict the added resistance. Relative prediction accuracy appears highest for smaller changes in resistance, with a systematic underestimation at larger resistances. Series resistance is shown to vary with irradiance levels with random errors below 1.5% standard deviation.

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