TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices King, Michael P.; Massey, Greg; Silva, A.; Cannon, Eh; Shaneyfelt, Marty R.; Loveless, Td; Ballast, J.; Cabanas-Holmen, M.; DiGregorio, Steven D.; Rice, William C.; Draper, Bruce L.; Oldgies, P.; Rodbell, K. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI
Leakage and Drive Characteristics of Planar 22-nm Partially-Depleted Silicon-on-Insulator and 14-nm Bulk and Quasi-Silicon-on-Insulator FinFET Devices King, Michael P.; Silva, Antoinette I.; DiGregorio, Steven D.; Rice, William C.; Massey, J.G.; Cannon, E.H.; Ballast, J.; Cabanas-Holmen, M.; Oldgies, P.; Rodbell, K.; Draper, Bruce L. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI