Publications

Calibrated values of many devices exhibit predictable drift over time. To provide an uncertainty statement valid over the entire calibration interval, one must account for drift. In this article, a method of accounting for drift is proposed based on guidance in the Guide to Expression of Uncertainty in Measurement. An additional uncertainty term is computed using a linear regression of historical measurement data, which is included along with the time-of-test uncertainty. This method is evaluated by analyzing its average out-of-tolerance (OOT) rate using a Monte Carlo simulation, which results in the desired 5% average OOT rate when the total uncertainty is expanded to a 95% confidence interval.

Abstract not provided.

NNSA Order 56XB (Chapter 13.2) requires the Primary Standards Laboratory (PSL) to perform technical surveys on the integrated contractors participating in the NNSA Standards and Calibration Program. In addition to Chapter 13.2, the surveys check for compliance with ISO/IEC 17025 and the PSLM. The PSL Technical Survey is a joint activity of the NNSA and the PSL. The PSL is responsible for the technical portion of the survey and the NNSA is responsible for the quality portion. The Technical Survey report is issued by the NNSA.

Advanced thin-film processing and packaging technologies are employed in the fabrication of new planar thin-film multijunction thermal converters (MJTCs). The processing, packaging, and design features build on experience gained from prior NIST demonstrations of thin-film converters and are optimized for improved sensitivity, bandwidth, manufacturability, and reliability.

New standards for ac current and voltage measurements, thin-film multifunction thermal converters (MJTCS), have been fabricated using thin-film and micro-electro-mechanical systems (MEMS) technology. Improved sensitivity and accuracy over single-junction thermoelements and targeted performance will allow new measurement approaches in traditionally troublesome areas such as the low frequency and high current regimes. A review is presented of new microfabrication techniques and packaging methods that have resulted from a collaborative effort at Sandia National Laboratories and the National Institute of Standards and Technology (MHZ).