Publications Details
Towards a disorder model for the Si/SiO2 interface
Baczewski, Andrew D.; Witzel, Wayne M.; Jacobson, Noah T.; Jock, Ryan M.; Sharma, Peter A.; Vudatha, Rohith; Ward, Daniel R.; Carroll, M.S.
Abstract not provided.
Baczewski, Andrew D.; Witzel, Wayne M.; Jacobson, Noah T.; Jock, Ryan M.; Sharma, Peter A.; Vudatha, Rohith; Ward, Daniel R.; Carroll, M.S.
Abstract not provided.