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TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices

King, Michael P.; Massey, Greg; Silva, A.; Cannon, Eh; Shaneyfelt, Marty R.; Loveless, Td; Ballast, J.; Cabanas-Holmen, M.; DiGregorio, Steven D.; Rice, William C.; Draper, Bruce L.; Oldgies, P.; Rodbell, K.

Abstract not provided.