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Sensitivity of charge detection techniques in electrostatically defined MOS quantum dots

Grubbs, Robert K.; Pluym, Tammy; Dominguez, Jason; Young, Ralph W.; Muller, Richard P.; Nielsen, Erik N.; Bishop, Nathaniel B.; Carroll, M.S.; Lilly, Michael; Tracy, Lisa A.; Nguyen, Khoi T.; Carr, Stephen M.; Lu, Tzu M.; Wendt, Joel R.; Stevens, Jeffrey

Abstract not provided.