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Publications / Conference Poster

Prediction and Validation of Residual Stress and Distortion Across Processes and Length Scales

Johnson, Kyle L.; Reu, P.L.; Farias, Paul; Moser, Daniel R.; Jared, Bradley H.; Whetten, Shaun R.; Chen, Mark J.Y.; Aquino, Wilkins; Walsh, Timothy; Bishop, Joseph E.

Abstract not provided.