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Near-field Imaging of Optical Resonance Modes in Silicon Metasurfaces Using Photoelectron Microscopy

Ohta, Taisuke; Boehm, Alexander M.; Doiron, Chloe F.; Gennaro, Sylvain; Kim, Andrew R.; Sinclair, Michael B.; Beechem, Thomas; Brener, Igal; Sarma, Raktim S.

Abstract not provided.