Publications Details

High-throughput density characterization of combinatorial thin films using x-ray reflectivity

Addamane, Sadhvikas J.; Dorman, Kyle R.; Desai, Saaketh; Rodriguez, Mark A.; Heile, Jonathan D.; Wampler, William R.; Dingreville, Remi P.M.; Boyce, Brad L.; Adams, David P.

Abstract not provided.