Publications Details
Grain Scale Modeling -- Impact of Constitutive Models
Yarrington, C.D.; Wixom, Ryan R.; Kittell, David E.; Thompson, A.P.; Shan, Tzu-Ray
Abstract not provided.
Yarrington, C.D.; Wixom, Ryan R.; Kittell, David E.; Thompson, A.P.; Shan, Tzu-Ray
Abstract not provided.