Publications Details

Effects of EMP Testing on Residential DC/AC Microinverters

Fierro, Andy; Le, Ken; Sanabria, David E.; Guttromson, Ross G.; Halligan, Matthew H.; Lehr, J.M.

Electromagnetic pulse (EMP) coupling into electronic devices can be destructive to components potentially causing device malfunction or failure. A large electromagnetic field generated from the EMP can induce large voltages and currents in components. As such, the effects of EMP on different devices needs to be understood to elucidate the effect of EMP on potentially vulnerable systems. This report presents test results for small-scale residential DC to AC solar panel microinverters that were subjected to high voltage impulses and currents. The impulses were intended to emulate an EMP coupling event to the AC and DC sides of the microinverter. State-of-health measurements were conducted to characterize device performance before and after each test.