Publications Details

Diagnosis of factors impacting yield in multilayer devices for superconducting electronics

Missert, Nancy; Jenkins, Mark W.; Tangyunyong, Paiboon; Mook, William M.; Vernik, I.; Kirichenko, A.; Mukhanov, O.; Wynn, A.; Day, A.L.; Bolkhovsky, V.; Johnson, L.

Abstract not provided.