Publications Details

Benchmark Tests for IV Fitting Algorithms

Hansen, Clifford H.; Jones, Abigail R.; Transue, Taos; Theristis, Marios

We propose a set of benchmark tests for current-voltage (IV) curve fitting algorithms. Benchmark tests enable transparent and repeatable comparisons among algorithms, allowing for measuring algorithm improvement over time. An absence of such tests contributes to the proliferation of fitting methods and inhibits achieving consensus on best practices. Benchmarks include simulated curves with known parameter solutions, with and without simulated measurement error. We implement the reference tests on an automated scoring platform and invite algorithm submissions in an open competition for accurate and performant algorithms.