Elastic Partial Functional PrincipalComponent Regression with UnmatchedBoundaries
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Jump to search filtersA Statistical Assessment of Zener Diode Behavior Using Functional Data Analysis
7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023
This paper presents an assessment of electrical device measurements using functional data analysis (FDA) on a test case of Zener diode devices. We employ three techniques from FDA to quantify the variability in device behavior, primarily due to production lot and demonstrate that this has a significant effect in our data set. We also argue for the expanded use of FDA methods in providing principled, quantitative analysis of electrical device data.
A Statistical Assessment of Zener Diode Behavior Using Functional Data Analysis
Abstract not provided.
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