Publications

In the course of a failure investigation, corrosion of the lands was occasionally found in developmental lots of semiconductor bridge (SCB) detonators and igniters. Evidence was found in both detonators and igniters of the gold layer being deposited on top of a corroded aluminum layer, but inspection of additional dies from the same wafer did not reveal any more corroded parts. In some detonators, evidence was found that corrosion of the aluminum layer also happened after the gold was deposited. Moisture and chloride must both be present for aluminum to corrode. A likely source for chloride is the adhesive used to bond the die to the header. Inspection of other SCB devices, both recently manufactured and manufactured about ten years ago, found no evidence for corrosion even in devices that contained SCBs with aluminum lands and no gold. Several manufacturing defects were noted such as stains, gouges in the gold layer due to tooling, and porosity of the gold layer. Results of atmospheric corrosion experiments confirmed that devices with a porous gold layer over the aluminum layer are susceptible to extensive corrosion when both moisture and chlorine are present. The extent of corrosion depends on the level of chlorine contamination, and corrosion did not occur when only moisture was present. Elimination of the gold plating on the lands eliminated corrosion of the lands in these experiments. Some questions remain unanswered, but enough information was gathered to recommend changes to materials and procedures. A second lot of detonators was successfully built using aluminum SCBs, limiting the use of Ablebond{trademark} adhesive, increasing the rigor in controlling exposure to moisture, and adding inspection steps.

Abstract not provided.

XTX8003 is an extrudable explosive composed of 80% PETN and 20% Sylgard 182 (polydimethylsiloxane). Knowledge of the aging characteristics of XTX8003 is desired to understand the relationship between chemical and physical changes and performance. This understanding will allow improved assessment of the current state and also projected lifetime of components that contain this material. A literature search revealed few published studies of the aging behavior of XTX8003 or a chemically similar material, LX-13. Two studies showed that detonation velocity had decreased after storage at 70 C for two years. Another study showed a 30% decrease in target penetration by conical shaped charge after 12 weeks of storage at 82 C. Only one study was found which evaluated chemical and physical changes, but no information was available to correlate performance degradation to chemical and physical changes in the material. In summary, the major changes seen in aged XTX8003 are in detonation velocity and particle morphology, but particle morphology does not appear to be the determining factor in the loss of detonation velocity. The study will continue at least 24 months, at which time the data will be evaluated to determine how best to continue with the remaining test samples.

This report describes the responses of three energetic materials (TNT, RDX, and PETN) to varying reactant ion chemistries and IMS cell temperatures. The following reactant ion chemistries were evaluated; air-dry; air-wet; methylene chloride-dry; methylene chloride-wet; methylene bromide-dry; nitrogen dioxide-wet; sulfur dioxide-wet. The temperature was varied between 160 - 220{degrees}C.