Publications

7 Results
Skip to search filters

Technical Safety Requirements for the Gamma Irradiation Facility (GIF)

Mahn, Jeffrey A.; Mahn, Jeffrey A.

This document provides the Technical Safety Requirements (TSR) for the Sandia National Laboratories Gamma Irradiation Facility (GIF). The TSR is a compilation of requirements that define the conditions, the safe boundaries, and the administrative controls necessary to ensure the safe operation of a nuclear facility and to reduce the potential risk to the public and facility workers from uncontrolled releases of radioactive or other hazardous materials. These requirements constitute an agreement between DOE and Sandia National Laboratories management regarding the safe operation of the Gamma Irradiation Facility.

More Details

Hot Cell Facility (HCF) Safety Analysis Report

Mitchell, Gerry W.; Longley, Susan W.; Philbin, Jeffrey S.; Mahn, Jeffrey A.; Berry, Donald T.; Schwers, Norman F.; Vanderbeek, Thomas E.; Naegeli, Robert E.; Mahn, Jeffrey A.

This Safety Analysis Report (SAR) is prepared in compliance with the requirements of DOE Order 5480.23, Nuclear Safety Analysis Reports, and has been written to the format and content guide of DOE-STD-3009-94 Preparation Guide for U. S. Department of Energy Nonreactor Nuclear Safety Analysis Reports. The Hot Cell Facility is a Hazard Category 2 nonreactor nuclear facility, and is operated by Sandia National Laboratories for the Department of Energy. This SAR provides a description of the HCF and its operations, an assessment of the hazards and potential accidents which may occur in the facility. The potential consequences and likelihood of these accidents are analyzed and described. Using the process and criteria described in DOE-STD-3009-94, safety-related structures, systems and components are identified, and the important safety functions of each SSC are described. Additionally, information which describes the safety management programs at SNL are described in ancillary chapters of the SAR.

More Details

A DOE-STD-3009 hazard and accident analysis methodology for non-reactor nuclear facilities

Mahn, Jeffrey A.; Walker, Sharon A.

This paper demonstrates the use of appropriate consequence evaluation criteria in conjunction with generic likelihood of occurrence data to produce consistent hazard analysis results for nonreactor nuclear facility Safety Analysis Reports (SAR). An additional objective is to demonstrate the use of generic likelihood of occurrence data as a means for deriving defendable accident sequence frequencies, thereby enabling the screening of potentially incredible events (<10{sup {minus}6} per year) from the design basis accident envelope. Generic likelihood of occurrence data has been used successfully in performing SAR hazard and accident analyses for two nonreactor nuclear facilities at Sandia National Laboratories. DOE-STD-3009-94 addresses and even encourages use of a qualitative binning technique for deriving and ranking nonreactor nuclear facility risks. However, qualitative techniques invariably lead to reviewer requests for more details associated with consequence or likelihood of occurrence bin assignments in the test of the SAR. Hazard analysis data displayed in simple worksheet format generally elicits questions about not only the assumptions behind the data, but also the quantitative bases for the assumptions themselves (engineering judgment may not be considered sufficient by some reviewers). This is especially true where the criteria for qualitative binning of likelihood of occurrence involves numerical ranges. Oftentimes reviewers want to see calculations or at least a discussion of event frequencies or failure probabilities to support likelihood of occurrence bin assignments. This may become a significant point of contention for events that have been binned as incredible. This paper will show how the use of readily available generic data can avoid many of the reviewer questions that will inevitably arise from strictly qualitative analyses, while not significantly increasing the overall burden on the analyst.

More Details
7 Results
7 Results