Publications

19 Results

Search results

Jump to search filters

New Generation Multijunction Thermal Converters at Sandia National Laboratories

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Johnson, Raegan L.; Meyrick, Aaron; Dominguez, Jason J.; Lukes, Karl L.; Stanford, Joshua S.; Cular, Stefan; O'Brien, Edward O.

Multijunction thermal converters are routinely used at many primary standards laboratories for ac voltage measurements and calibrations. After nearly two decades of inactivity, the Primary Standards Laboratory at Sandia National Laboratories has reestablished the process of fabricating silicon based multijunction thermal converters. Initial results indicate the devices perform similarly to devices fabricated circa 2001 with ac-dc differences of less than 2 mu mathrm{V}/mathrm{V} over the frequency range of 20 Hz to 20 kHz. From 20 kHz to 1 MHz, the ac-dc difference was higher, but remained below 200 mu mathrm{V}/mathrm{V}. In addition to presenting these results, new design considerations, such as high-resistivity substrates for high-frequency applications, are discussed.

More Details

PSL-AC-CP-1102-004-03: Electrostatic Discharge Simulator Kit Model 930D and Associated Current-Viewing Resistor (V.04)

O'Brien, Edward O.

This document provides instructions for calibrating the Electro-Tech (ETS) electrostatic discharge (ESD) simulator, Model 930D. The calibration shall meet the ± 5% specification for resistance and capacitance as specified in MIL-STD-331C 2009 newer. A series of direct measurements of the Device Under Test (DUT) output at 25 kV using a calibrated LeCroy HDO 6104 oscilloscope (or equivalent 1 MΩ) input impedance storage oscilloscope) are recorded through the 500-pF capacitor, 500-Ω resistor, and a 1-Ω Current Viewing Resistor (CVR). The certified value of the DUT's 25 kV output is calculated using Ohms Law and the certified system resistance and capacitance described in this procedure. Read this document in its entirety before proceeding with the calibration.

More Details

Acoustic Chamber Characterization

O'Brien, Edward O.; Kypta, Timothy K.; Stanford, Joshua S.; Tran, Hy D.

The basis of this project was to characterize the various uncertainty contributors of an acoustic chamber. The acoustic chamber will be used to calibrate and characterize infrasound sensors used in the field in the frequency range of 0.001 Hz to 4 Hz. The components characterized include the internal volume of the chamber, the piston area of the speaker creating the dynamic sound wave, the environmental stabilization of the chamber and the chamber's leak rate. Also, the resonant frequency of the chamber was evaluated and found to be far outside the frequency band of interest.

More Details
19 Results
19 Results