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Using engineered defects to understand the seed for instabilities in current-driven metal

Yu, Edmund; Awe, Thomas J.; Hutchinson, Trevor M.; Hatch, Maren W.; Yates, Kevin; Cochrane, Kyle; Bauer, Bruno S.; Tomlinson, Kurt; Tatum, William; Peterson, K.J.; Yager-Elorriaga, David A.; Hutsel, Brian T.; Harding, Eric H.; Klemmer, Aidan W.; Gilmore, Mark; Shipley, Gabriel A.; Kreher, Seth

Abstract not provided.