Publications Details

Towards data-driven next-generation transmission electron microscopy

Spurgeon, Steven R.; Ophus, Colin; Jones, Lewys; Kalinin, Sergei V.; Olszta, Matthew J.; Dunin-Borkowski, Rafal E.; Salmon, Norman; Hattar, Khalid M.; Yang, Wei-Chang D.; Sharma, Renu; Du, Yingge; Chiaramonti, Ann; Zheng, Haimei; Buck, Edgar C.; Kovarik, Libor; Penn, R.L.; Li, Dongsheng; Zhang, Xin; Murayama, Mitsuhiro; Taheri, Mitra L.

The rapidly evolving field of electron microscopy touches nearly every aspect of mod- ern life, underpinning impactful materials discoveries in applications such as quan- tum information science, energy, and medicine. As the field enters a new decade, a paradigm has begun to emerge in which the convergence of advanced instrumenta- tion, robust in-situ platforms, and data-driven experimentation will help researchers distill observations of ever more complex systems into meaningful physical properties and mechanisms. Here we present the findings from the first in a series of work- shops gathering together scientists and technologists across academia, government laboratories, and industry, with the goal to develop a critical roadmap for next- generation transmission electron microscopy (NexTEM). We provide a perspective on the present and emerging state-of-the-art, highlighting progress and the crucial developments still needed to realize the materials of tomorrow.