Publications Details
Total-dose radiation hardness assurance for space electronics
An improved standard total-dose test method is described to qualify electronics for a low-dose radiation environment typical of space systems. The method consists of {sup 60}Co irradiation at a dose rate of 1--3 Gy(Si)/s (100--300 rad(Si)/s) and a subsequent 373 K (100{degree}C) bake. New initiatives in radiation hardness assurance are also briefly discussed, including the Qualified Manufacturers List (QML) test methodology and the possible use of 1/f noise measurements as a nondestructive screen for oxide-trap charge related failure. 8 refs.