Publications Details

Switching Reliability Characterization of Vertical GaN PiN Diodes

Slobodyan, Oleksiy S.; Sandoval, Stephanie; Flicker, Jack D.; Kaplar, Robert K.; Matthews, Christopher; Van Heukelom, Michael V.; Atcitty, Stanley A.; Kizilyalli, Isik; Aktas, Ozgur

Abstract not provided.