Publications Details

Storage Container Outgassing

Archuleta, Kim A.; Piatt, Rochelle P.; Ohlhausen, J.A.

The correct storage for critical surface samples is a concern for high fidelity testing. This study compares some common storage for clean parts at Sandia. Time of Flight Secondary Ion Mass Spectroscopy (ToFSIMS) and contact angle are employed to measure relative amount of residue on surface of clean metal sample after extended storage.