Publications Details

Single Event Latchup Sensitive Volume Model for a 180-nm SRAM Test Structure

Wang, Peng; Sternberg, Andrew L.; Sierawski, Brian D.; Zhang, En X.; Tonigan, A.M.; Brewer, Rachel M.; Dodds, Nathaniel A.; Vizkelethy, Gyorgy V.; Jordan, Scott L.; Fleetwood, Daniel M.; Reed, Robert A.; Schrimpf, Ronald D.

Abstract not provided.