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Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Field-Programmable Gate Array and Multi-Processor System-on-Chip Devices with Heavy Ion and Neutron Irradiation

Lee, David S.; King, Michael P.; Evans, William L.; Rice, William C.; Wirthlin, Michael; Cannon, Matthew; Perez-Celis, Andres; Anderson, Jordan

Abstract not provided.