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Probing the limits of STM field-emission patterned Si:P δ-doped devices

Rudolph, Martin; Carr, Stephen M.; Subramania, Ganapathi S.; Ten Eyck, Gregory A.; Dominguez, Jason J.; Pluym, Tammy; Lilly, Michael P.; Carroll, M.S.; Bussmann, Ezra

Abstract not provided.