Publications Details
Probing the limits of STM field-emission patterned Si:P δ-doped devices
Rudolph, Martin; Carr, Stephen M.; Subramania, Ganapathi S.; Ten Eyck, Gregory A.; Dominguez, Jason; Pluym, Tammy; Lilly, Michael; Carroll, M.S.; Bussmann, Ezra
Abstract not provided.