Publications Details
Probing limits of STM field emission patterned Si:P $\delta$-doped devices
Rudolph, Martin; Carr, Stephen M.; Subramania, Ganapathi S.; Ten Eyck, Gregory A.; Dominguez, Jason; Pluym, Tammy; Lilly, Michael; Carroll, M.S.; Bussmann, Ezra
Abstract not provided.