Publications Details
Low cost simulator for strategic radiation environments
Recent experimental works on the effect of dose rate on the total dose failure threshold of MOS devices have shown that the failure level is strategic environments may be less than the failure level measured in the laboratory by a factor of 3 to 10. This difference in dose rate response raises concerns about using laboratory sources to predict the radiation hardness in strategic environments. A solution to the problem of determining the total dose hardness of piece parts is to perform lot acceptance testing at relevant dose rates such that the time dependent effects can be directly observed. A low cost method of measuring the total dose hardness of piece parts in the laboratory at requisite dose rates is presented. 11 refs., 5 figs.