Publications Details

Layer-Dependent Band Alignment of MoS2 WS2 and MoSe2 Flakes on SiO2 Measured by Photoemission Electron Microscopy

Berg, Morgann B.; Ohta, Taisuke O.; Chan, Calvin C.; Keyshar, Kunttal; Mohite, Aditya D.; Bilgin, Ismail; Liu, Fangze; Yamaguchi, Hisato; Vajtai, Robert; Gupta, Gautam; Kar, Swastik; Ajayan, Pulickel

Abstract not provided.