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I{sub DDQ} Testing and Defect Classes: A Tutorial

Soden, Jerry M.

I{sub DDQ} testing of CMOSICs is a technique for production quality and reliability improvement, design validation, and failure analysis. The origin and basic concepts of I{sub DDQ} testing are reviewed. The relationship of I{sub DDQ} testing to other test methods is considered in the context of the whole IC life cycle from design, fabrication, and test through end use. A comprehensive test strategy is described that uses defect classes based on defect electrical properties rather than traditional fault models.