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Publications / Conference Poster

Effect of Flux on the Defects and Electrical Behavior in Si Devices irradiated with He Ions

Aguirre, Brandon A.; Vizkelethy, Gyorgy V.; Vaandrager, Bastiaan L.; Martin, William J.; Seidl, P.; Persaud, A.; Ji, Q.; Ludewigt, B.A.; Schenkel, T.; Bielejec, Edward S.

Abstract not provided.