Publications Details
Charge Trap Layer Supercharging for Improved Bit Reliability in 3D NAND Flash Under Proton Irradiation
Teijeiro, Antonio E.; Breeding, Matthew L.; Young, Joshua; Hughart, David R.; Wilcox, Edward
Abstract not provided.
Teijeiro, Antonio E.; Breeding, Matthew L.; Young, Joshua; Hughart, David R.; Wilcox, Edward
Abstract not provided.