Publications Details
CHARACTERIZATION OF MOS2 FILMS VIA SIMULTANEOUS GRAZING INCIDENCE X-RAY DIFFRACTION AND GRAZING INCIDENCE X-RAY FLUORESCENCE (GIXRD/GIXRF)
Rodriguez, Mark A.; Babuska, Tomas F.; Dugger, Michael T.; Griego, James J.M.; Curry, John C.
Abstract not provided.