Publications Details

Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance

King, Michael P.; Wu, K.; Draper, Bruce L.; Meisenheimer, Timothy L.; Zhang, E.; Shetler, K.J.; Haeffner, T.D.; Massengill, Lloyd W.

Abstract not provided.