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Advanced, non-destructive defect localization in microelectronics

Colr, Edward I.

Abstract not provided.

Additional Metadata

SAND Number

SAND2007-7751C

Date Published

November 1, 2007

Research Partner

Sandia National Laboratories

Links

OSTI

Subject

Engineering

Keywords

Defects

Microelectronic circuits

Nondestructive testing

Reliability

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