Publications Details

A Statistical Assessment of Zener Diode Behavior Using Functional Data Analysis

Champon, Xiaoxia; Angeles, David; Buchheit, Thomas E.; Canfield, David; Tucker, James D.; Adams, Jason R.

This paper presents an assessment of electrical device measurements using functional data analysis (FDA) on a test case of Zener diode devices. We employ three techniques from FDA to quantify the variability in device behavior, primarily due to production lot and demonstrate that this has a significant effect in our data set. We also argue for the expanded use of FDA methods in providing principled, quantitative analysis of electrical device data.