Publications

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Optical networks hold great promise for improving the performance of supercomputers, yet they have always proven just out of reach. This talk will examine the potential of optical interconnects, barriers to adoption, and possible solutions from hardware/software co-design.

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Fault tolerance is a key challenge to building the first exascale system. To understand the potential impacts of failures on next-generation systems, significant effort has been devoted to collecting, characterizing and analyzing failures on current systems. These studies require large volumes of data and complex analysis. Because the occurrence of failures in large-scale systems is unpredictable, failures are commonly modeled as a stochastic process. Failure data from current systems is examined in an attempt to identify the underlying probability distribution and its statistical properties. In this paper, we use modeling to examine the impact of failure distributions on the time-to-solution and the optimal checkpoint interval of applications that use coordinated checkpoint/restart. Using this approach, we show that as failures become more frequent, the failure distribution has a larger influence on application performance. We also show that as failure times are less tightly grouped (i.e., as the standard deviation increases) the underlying probability distribution has a greater impact on application performance. Finally, we show that computing the checkpoint interval based on the assumption that failures are exponentially distributed has a modest impact on application performance even when failures are drawn from a different distribution. Our work provides critical analysis and guidance to the process of analyzing failure data in the context of coordinated checkpoint/restart. Specifically, the data presented in this paper helps to distinguish cases where the failure distribution has a strong influence on application performance from those cases when the failure distribution has relatively little impact.

We present a study of the 'snap-back' regime of resistive switching hysteresis in bipolar TaOx memristors, identifying power signatures in the electronic transport. Using a simple model based on the thermal and electric field acceleration of ionic mobilities, we provide evidence that the 'snap-back' transition represents a crossover from a coupled thermal and electric-field regime to a primarily thermal regime, and is dictated by the reconnection of a ruptured conducting filament. We discuss how these power signatures can be used to limit filament radius growth, which is important for operational properties such as power, speed, and retention.

We explore how reliable the ALEGRA MHD code is in its static limit. Also, we explore (in the quasi-static approximation) the process of evolution of the magnetic fields inside and outside an inclusion and the parameters for which the quasi-static approach provides for self-consistent results.