Proton and Heavy Ion SEE Data on NVIDIA and AMD GPUs
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Jump to search filtersProton and Heavy Ion SEE Data on NVIDIA and AMD GPUs
IEEE Radiation Effects Data Workshop
We present the SEU sensitivity and SEL results from proton and heavy ion testing performed on NVIDIA Xavier NX and AMD Ryzen V1605B GPU devices in both static and dynamic operation.
Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation
Abstract not provided.
Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation
Abstract not provided.
Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions
Abstract not provided.
Heavy-Ion Irradiation of the Xilinx Kintex UltraScale+ FPGA
Abstract not provided.
Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Field-Programmable Gate Array and Multi-Processor System-on-Chip Devices with Heavy Ion and Neutron Irradiation
Abstract not provided.
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