Reverse engineering industrial control system field devices Mulder, John M.; Schwartz, Moses D.; Berg, Michael J.; Van Houten, Jonathan R.; Urrea, Jorge M.; Pease, Alex N. Abstract not provided. More Details TYPE Conference YEAR 2012 OSTI
LPC/SPI Analysis Tool Berg, Michael J.; Kucera, Brent D.; Hoff, Christopher H. Abstract not provided. More Details TYPE Conference YEAR 2010 OSTI