Localized Electromagnetic Probing for Failure Analysis in Noisy Environments
Local electromagnetic probing was developed to allow investigation of a variety of devices in noisy electrical environments. The quality and applicability of this technique was assessed during this one year LDRD. To obtain details about the experimental setup, the devices imaged, and the experimental details, please refer to the classified report from the project manager, Will Zortman, or the NSP IA lead, Kristina Czuchlewski.