Publications Details
X-ray diffraction study of clusters in a-tC films
The authors performed an X-ray diffraction study of tetrahedral-coordinated-amorphous carbon (a-tC) films prepared by pulsed laser deposition (PLD). Samples properties were analyzed as a function of laser energy and thickness. For all thicknesses and laser energies, films were made up of clusters with a basic unit size of 7 - 11 nm. Thicker films, as well as films prepared at higher laser densities exhibit larger clusters, in the tens of nanometers. The clusters are not readily observable by AFM, which may indicate the presence of a flat (graphitized) top film surface.