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Transient power supply voltage (v{sub DDT}) analysis for detecting IC defects

Cole Jr., E.I.; Soden, J.M.; Beegle, R.W.

Transient power supply voltage (V{sub DDT}) analysis is a new testing technique demonstrated as a powerful alternative and complement to I{sub DDQ} testing. V{sub DDT} takes advantage of the limited response time of a voltage supply to the changing power demands of an IC during operation. Changes in the V{sub DD} response time are used to detect increases in power demand with resolutions of 100 nA at 100 kHz, 1 {mu}A at 1 MHz, and 2.5 {mu}A at 1.5 MHz. These current sensitivities have been shown for ICs with quiescent currents < 0.1 {mu}A and > 300 {mu}A. The V{sub DDT} signal acquisition protocols, frequency versus sensitivity tradeoffs, hardware considerations and limitations, data examples, and areas for future research are described.