Publications Details
The effects of heavy particle radiation on semiconductor devices
Heavy particle radiation can produce upsets in digital circuits as well as trigger burn out or breakdown in power MOSFETs and MNOS nonvolatile memories. Latch-up may also be stimulated by heavy ions. This report covers work done on the effects of heavy particle radiation on PN junctions, CMOS inverters, CMOS latch, MOSFET and non-volatile memories. 15 refs., 3 figs.