Publications Details

Recent advances with quiescent power supply current (I sub DDQ ) testing at Sandia using the HP82000

Righter, A.W.

Last year at the HP82000 Users Group Meeting, Sandia National Laboratories gave a presentation on I{sub DDQ} testing. This year, we will present some advances on this testing including DUT board fixturing, external DC PMU measurement, and automatic IDD-All circuit calibration. This paper is geared more toward implementation than theory, with results presented from Sandia tests. After a brief summary I{sub DDQ} theory and testing concepts, we will describe how the break (hold state) vector and data formatting present a test vector generation concern for the HP82000. We than discuss fixturing of the DUT board for both types of I{sub DDQ} measurement, and how the continuity test and test vector generation must be taken into account. Results of a test including continuity, IDD-All and I{sub DDQ} Value measurements will be shown. Next, measurement of low current using an external PMU is discussed, including noise considerations, implementation and some test results showing nA-range measurements. We then present a method for automatic calibration of the IDD-All analog comparator circuit using RM BASIC on the HP82000, with implementation and measurement results. Finally, future directions for research in this area will be explored. 14 refs., 16 figs.